Home>ISO Standards>BS ISO 15932:2013 pdf free

BS ISO 15932:2013 pdf free

BS ISO 15932:2013 pdf free.Microbeam analysis一Analytical electron microscopy一Vocabulary
identifiable minimum energy separation in EDS analysis, which depends upon the detected X-ray energy,the type of detector, and the instrument on which the detector is installed
microscopic elemental and electronic state analysis method using inelastically scattered electrons resulting from interaction with electrons and phonon in the specimen in which the energy loss is measured via an electron spectrometer and interpreted in terms of what caused the energy loss
apparatus which passes electrons with a specific kinetic energy, which is effective for the subtraction of inelastic electron background in image and diffraction pattern formation, and also for the acquisition of energy-filtered images for analytical purposes
effect in which the yield of a characteristic X-ray depends upon the atomic numbers of elements in the specimen due to the back scattering of incident electrons
two-dimensional detector which utilizes photostimulated luminescence of europium
CCD camera which uses a lower refreshing rate than an ordinary CD camera system to improve image quality by increasing the signal-to-noise ratio
solid-state detector which measures the intensity and the energy of X-rays emitted from the specimen
EDS detector lacking a window material in front of the detector which increases the measurement sensitivity for soft X-rays (< 1 keV) enables the detection of elements with an atomic number larger than that of boron
EDS detector which uses an aluminium-coated organic thin film as a window material in front of the detector, increasing the measurement sensitivity for soft X-rays (< 1 keV) and enabling the detection of light elements
EDS detector fitted with a beryllium window of 8 μm to 10 μm in thickness, which is suitable for measuring hard X-rays (> 1 keV)
detector used in STEM to collect a dark-field image by integrating the scattered intensity intercepted by an annulus around the transmitted beam
Note 1 to entry: Z-contrast due to Rutherford scattering is obtained with a high-scattering angle, while a dark-field image is obtained with a low-scattering angle.BS ISO 15932 pdf download.

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